Spectroellipsometric studies of 0.9PbMg_1/3Nb_2/3O₃-0.1PbTiO₃thin films

Keyphrases

• Electrode Films 100%
• LaAlO3 66%
• Film Thickness 66%
• Dielectric Constant 66%
• Leakage Current 66%
• PMN-PT 66%
• Scanning Electron Microscopy 33%
• Structural Properties 33%
• X Ray Diffraction 33%
• Pulsed Laser Deposition 33%
• Impurities 33%
• Perovskite 33%
• Electrometer 33%
• Electrical Properties 33%
• Surface Morphology 33%
• Impedance Analyzer 33%
• Heteroepitaxial Structures 33%
• Structural Inhomogeneity 33%
• Interface Thickness 33%
• Microroughness 33%
• Refractive Index Inhomogeneity 33%
• Depth Profile 33%
• Spectroellipsometry 33%

Material Science

• Film 100%
• Film Thickness 16%
• Permittivity 16%
• Refractive Index 8%
• Scanning Electron Microscopy 8%
• Surface Morphology 8%
• Structural Property 8%
• Pulsed Laser Deposition 8%
• Surface (Surface Science) 8%
• X-Ray Diffraction 8%