Abstract
A scanner characterization method is proposed to estimate spectral reflectance from scanner responses by using an optimized adaptive estimation method. In contrast to our previous study [J. Opt. Soc. Am. A 21, 1125 (2004)], this method considers the weighting of training samples. It is demonstrated that the color accuracy of this method is only slightly affected by the number of training samples and can provide more accurate reflectance estimation.
| Original language | English |
|---|---|
| Pages (from-to) | 1566-1569 |
| Number of pages | 4 |
| Journal | Journal of the Optical Society of America A: Optics and Image Science, and Vision |
| Volume | 23 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 1 Jan 2006 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Computer Vision and Pattern Recognition