TY - JOUR
T1 - Sparse-view irradiation processing volumetric additive manufacturing
AU - Wang, Huiyuan
AU - Gao, Fangyuan
AU - Shi, Yu
AU - Wang, Kai
AU - Wei, Xinbo
AU - Ma, Chunyang
AU - Wen, Xiewen
AU - Chen, Xueli
AU - Li, Jiebo
N1 - Publisher Copyright:
© 2025 The Author(s). Published by IOP Publishing Ltd on behalf of the IMMT.
PY - 2025/12/1
Y1 - 2025/12/1
N2 - Volumetric additive manufacturing (VAM) transforms traditional 2D light pattern projection into spatial light field energy superposition, maximizing the utilization of radiated light and allowing for ultra-fast, support-free printing, which has specific applications in fields such as life sciences and optics. However, traditional VAM processes require numerous projections and extensive computational preparation, limiting practical applications due to low projection efficiency and prolonged calculation times. In this study, we developed sparse-view irradiation processing VAM (SVIP-VAM), employing an optimized odd-even (OE) irradiation strategy inspired by sparse-view computed tomography. Theoretically, we demonstrated structural contour reconstruction feasibility with as few as 8 projections. Using this sparse-view approach, we achieved high-quality fabrication with only 15 projections, enhancing each projection efficiency by over 60 times and reducing projection set computational time by nearly 10-fold. Ultimately, this efficient sparse-view method significantly expands VAM applications into fields requiring rapid manufacturing, such as tissue engineering, medical implants, and aerospace manufacturing.
AB - Volumetric additive manufacturing (VAM) transforms traditional 2D light pattern projection into spatial light field energy superposition, maximizing the utilization of radiated light and allowing for ultra-fast, support-free printing, which has specific applications in fields such as life sciences and optics. However, traditional VAM processes require numerous projections and extensive computational preparation, limiting practical applications due to low projection efficiency and prolonged calculation times. In this study, we developed sparse-view irradiation processing VAM (SVIP-VAM), employing an optimized odd-even (OE) irradiation strategy inspired by sparse-view computed tomography. Theoretically, we demonstrated structural contour reconstruction feasibility with as few as 8 projections. Using this sparse-view approach, we achieved high-quality fabrication with only 15 projections, enhancing each projection efficiency by over 60 times and reducing projection set computational time by nearly 10-fold. Ultimately, this efficient sparse-view method significantly expands VAM applications into fields requiring rapid manufacturing, such as tissue engineering, medical implants, and aerospace manufacturing.
KW - volumetric additive manufacturing
KW - 3D printing
KW - sparse view
KW - odd-even irradiation
UR - https://www.scopus.com/pages/publications/105011052719
U2 - 10.1088/2631-7990/adebbf
DO - 10.1088/2631-7990/adebbf
M3 - Journal article
SN - 2631-8644
VL - 7
JO - International Journal of Extreme Manufacturing
JF - International Journal of Extreme Manufacturing
IS - 6
M1 - 065001
ER -