Soft-mode phonons in SrTiO3 thin films studied by far-infrared ellipsometry and Raman scattering

A. A. Sirenko; C. Bernhard; A. Golnik; I. A. Akimov; A. M. Clark; Jianhua Hao; X. X. Xi

Soft-mode phonons in SrTiO₃ thin films studied by far-infrared ellipsometry and Raman scattering

A. A. Sirenko, C. Bernhard, A. Golnik, I. A. Akimov, A. M. Clark, Jianhua Hao, X. X. Xi

Research output: Journal article publication › Conference article › Academic research › peer-review

Abstract

We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

Original language	English
Pages (from-to)	245-250
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	603
Publication status	Published - 11 Dec 2000
Externally published	Yes
Event	Materials issues for Tunable RF and Microwave Devices - Boston, MA, United States Duration: 30 Nov 1999 → 2 Dec 1999

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Cite this

@article{1441ecf30ef94249a14121fe33224613,

title = "Soft-mode phonons in SrTiO3 thin films studied by far-infrared ellipsometry and Raman scattering",

abstract = "We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.",

author = "Sirenko, {A. A.} and C. Bernhard and A. Golnik and Akimov, {I. A.} and Clark, {A. M.} and Jianhua Hao and Xi, {X. X.}",

year = "2000",

month = dec,

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language = "English",

volume = "603",

pages = "245--250",

journal = "Materials Research Society Symposium - Proceedings",

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publisher = "Materials Research Society",

note = "Materials issues for Tunable RF and Microwave Devices ; Conference date: 30-11-1999 Through 02-12-1999",

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TY - JOUR

T1 - Soft-mode phonons in SrTiO3 thin films studied by far-infrared ellipsometry and Raman scattering

AU - Sirenko, A. A.

AU - Bernhard, C.

AU - Golnik, A.

AU - Akimov, I. A.

AU - Clark, A. M.

AU - Hao, Jianhua

AU - Xi, X. X.

PY - 2000/12/11

Y1 - 2000/12/11

N2 - We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

AB - We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

UR - http://www.scopus.com/inward/record.url?scp=0033678128&partnerID=8YFLogxK

M3 - Conference article

SN - 0272-9172

VL - 603

SP - 245

EP - 250

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Materials issues for Tunable RF and Microwave Devices

Y2 - 30 November 1999 through 2 December 1999

ER -

Soft-mode phonons in SrTiO₃ thin films studied by far-infrared ellipsometry and Raman scattering

Abstract

ASJC Scopus subject areas

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