Single-pixel optical microscopy through complex scattering media with temporal correction

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

Optical microscopy plays an important role in various areas, but could suffer from quality degradation in complex media. While single-pixel imaging (SPI) can work under scattering conditions, it may fail in complex environments, such as time-varying turbidities. A complex scattering environment induces a series of dynamic scaling factors that disrupt pattern-measurement correlation, causing severe destroy in object reconstruction. In this paper, we report a method for single-pixel microscopy through complex scattering media. A correction mechanism integrates a fixed pattern as temporal carriers for each illumination pattern. This approach can be applied to correct scattering-induced scaling factors. It also enables high-quality reconstruction using corrected measurements. Optical experiments are conducted to show high effectiveness and high robustness of the proposed method. The method has potential for the applications through complex media.

Original languageEnglish
Title of host publicationSixteenth International Conference on Information Optics and Photonics, CIOP 2025
EditorsYue Yang
PublisherSPIE
Pages1-4
Number of pages4
ISBN (Electronic)9781510699274
DOIs
Publication statusPublished - 8 Dec 2025
Event16th International Conference on Information Optics and Photonics, CIOP 2025 - Xi'an, China
Duration: 10 Aug 202514 Aug 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13990
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference16th International Conference on Information Optics and Photonics, CIOP 2025
Country/TerritoryChina
CityXi'an
Period10/08/2514/08/25

Keywords

  • complex scattering media
  • single-pixel detection
  • Single-pixel microscopy
  • temporal corrections

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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