Single beam photoreflectance microscopy system with electronic feedback

M. B. Suddendorf, Michael Geoffrey Somekh

Research output: Journal article publicationJournal articleAcademic researchpeer-review

2 Citations (Scopus)

Abstract

A new photoreflectance (PR) system which uses only a single optical beam is described. The PR signal is detected at the second harmonic of the modulation frequency, contained in the backreflected light. To reliably measure this small signal, the second harmonic content of the incident beam is reduced by feedback to the modulator.
Original languageEnglish
Pages (from-to)398-399
Number of pages2
JournalElectronics Letters
Volume30
Issue number5
DOIs
Publication statusPublished - 1 Jan 1994
Externally publishedYes

Keywords

  • Laser beam applications
  • Scanning optical microscopes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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