A new photoreflectance (PR) system which uses only a single optical beam is described. The PR signal is detected at the second harmonic of the modulation frequency, contained in the backreflected light. To reliably measure this small signal, the second harmonic content of the incident beam is reduced by feedback to the modulator.
- Laser beam applications
- Scanning optical microscopes
ASJC Scopus subject areas
- Electrical and Electronic Engineering