Abstract
A new photoreflectance (PR) system which uses only a single optical beam is described. The PR signal is detected at the second harmonic of the modulation frequency, contained in the backreflected light. To reliably measure this small signal, the second harmonic content of the incident beam is reduced by feedback to the modulator.
Original language | English |
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Pages (from-to) | 398-399 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 30 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1 Jan 1994 |
Externally published | Yes |
Keywords
- Laser beam applications
- Scanning optical microscopes
ASJC Scopus subject areas
- Electrical and Electronic Engineering