Simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements

Siu Chung Wong; Y. S. Lee; Chi Kong Tse; M. Chow

Simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements

Siu Chung Wong, Y. S. Lee, Chi Kong Tse, M. Chow

The Hong Kong Polytechnic University

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

Abstract

A simple simulation method that evaluates the stability of analog circuits in the presence of reactive parasitic elements is proposed. This method also gives the range of values and the exact locations of the parasitic elements for which a given stable circuit will be rendered oscillatory.

Original language	English
Title of host publication	IEEE Region 10 Annual International Conference, Proceedings/TENCON
Publisher	IEEE
Pages	163-166
Number of pages	4
Publication status	Published - 1 Dec 1995
Event	Proceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95 - Hong Kong, Hong Kong Duration: 6 Nov 1995 → 10 Nov 1995

Conference

Conference	Proceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95
Country/Territory	Hong Kong
City	Hong Kong
Period	6/11/95 → 10/11/95

ASJC Scopus subject areas

General Engineering

Cite this

@inproceedings{9cadfe3a75a549a39b0e13c6afa4548d,

title = "Simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements",

abstract = "A simple simulation method that evaluates the stability of analog circuits in the presence of reactive parasitic elements is proposed. This method also gives the range of values and the exact locations of the parasitic elements for which a given stable circuit will be rendered oscillatory.",

author = "Wong, {Siu Chung} and Lee, {Y. S.} and Tse, {Chi Kong} and M. Chow",

year = "1995",

month = dec,

day = "1",

language = "English",

pages = "163--166",

booktitle = "IEEE Region 10 Annual International Conference, Proceedings/TENCON",

publisher = "IEEE",

address = "United States",

note = "Proceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95 ; Conference date: 06-11-1995 Through 10-11-1995",

}

Wong, SC, Lee, YS, Tse, CK & Chow, M 1995, Simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements. in IEEE Region 10 Annual International Conference, Proceedings/TENCON. IEEE, pp. 163-166, Proceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95, Hong Kong, Hong Kong, 6/11/95.

Simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements. / Wong, Siu Chung; Lee, Y. S.; Tse, Chi Kong et al.
IEEE Region 10 Annual International Conference, Proceedings/TENCON. IEEE, 1995. p. 163-166.

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

TY - GEN

T1 - Simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements

AU - Wong, Siu Chung

AU - Lee, Y. S.

AU - Tse, Chi Kong

AU - Chow, M.

PY - 1995/12/1

Y1 - 1995/12/1

N2 - A simple simulation method that evaluates the stability of analog circuits in the presence of reactive parasitic elements is proposed. This method also gives the range of values and the exact locations of the parasitic elements for which a given stable circuit will be rendered oscillatory.

AB - A simple simulation method that evaluates the stability of analog circuits in the presence of reactive parasitic elements is proposed. This method also gives the range of values and the exact locations of the parasitic elements for which a given stable circuit will be rendered oscillatory.

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M3 - Conference article published in proceeding or book

SP - 163

EP - 166

BT - IEEE Region 10 Annual International Conference, Proceedings/TENCON

PB - IEEE

T2 - Proceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95

Y2 - 6 November 1995 through 10 November 1995

ER -

Simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements

Abstract

Conference

ASJC Scopus subject areas

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