Simulation technique for evaluating analog circuits stability in the presence of reactive parasitic elements

Siu Chung Wong, Y. S. Lee, Chi Kong Tse, M. Chow

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

A simple simulation method that evaluates the stability of analog circuits in the presence of reactive parasitic elements is proposed. This method also gives the range of values and the exact locations of the parasitic elements for which a given stable circuit will be rendered oscillatory.
Original languageEnglish
Title of host publicationIEEE Region 10 Annual International Conference, Proceedings/TENCON
PublisherIEEE
Pages163-166
Number of pages4
Publication statusPublished - 1 Dec 1995
EventProceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95 - Hong Kong, Hong Kong
Duration: 6 Nov 199510 Nov 1995

Conference

ConferenceProceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95
CountryHong Kong
CityHong Kong
Period6/11/9510/11/95

ASJC Scopus subject areas

  • Engineering(all)

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