Signed and accurate measurement of phase offset in optical DPSK demodulator

Jian Zhao; Pak Tao Lau; Chao Lu; Hwa Yaw Tam; Ping Kong Alexander Wai

doi:10.1109/LPT.2010.2049012

Signed and accurate measurement of phase offset in optical DPSK demodulator

Jian Zhao, Pak Tao Lau, Chao Lu, Hwa Yaw Tam, Ping Kong Alexander Wai

The Hong Kong Polytechnic University

Research output: Journal article publication › Journal article › Academic research › peer-review

1 Citation (Scopus)

Abstract

A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.

Original language	English
Article number	5458064
Pages (from-to)	1018-1020
Number of pages	3
Journal	IEEE Photonics Technology Letters
Volume	22
Issue number	14
DOIs	https://doi.org/10.1109/LPT.2010.2049012
Publication status	Published - 24 Jun 2010

Keywords

Chromatic dispersion (CD)
delay interferometer (DI)
delay-tap sampling
differential phase-shift keying (DPSK)
optical fiber communication
performance monitoring
phase offset

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

More information

10.1109/LPT.2010.2049012

Cite this

@article{b82d24a68fa44f4eaf0812587b9e23b9,

title = "Signed and accurate measurement of phase offset in optical DPSK demodulator",

abstract = "A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.",

keywords = "Chromatic dispersion (CD), delay interferometer (DI), delay-tap sampling, differential phase-shift keying (DPSK), optical fiber communication, performance monitoring, phase offset",

author = "Jian Zhao and Lau, {Pak Tao} and Chao Lu and Tam, {Hwa Yaw} and Wai, {Ping Kong Alexander}",

year = "2010",

month = jun,

day = "24",

doi = "10.1109/LPT.2010.2049012",

language = "English",

volume = "22",

pages = "1018--1020",

journal = "IEEE Photonics Technology Letters",

issn = "1041-1135",

publisher = "IEEE",

number = "14",

}

TY - JOUR

T1 - Signed and accurate measurement of phase offset in optical DPSK demodulator

AU - Zhao, Jian

AU - Lau, Pak Tao

AU - Lu, Chao

AU - Tam, Hwa Yaw

AU - Wai, Ping Kong Alexander

PY - 2010/6/24

Y1 - 2010/6/24

N2 - A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.

AB - A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.

KW - Chromatic dispersion (CD)

KW - delay interferometer (DI)

KW - delay-tap sampling

KW - differential phase-shift keying (DPSK)

KW - optical fiber communication

KW - performance monitoring

KW - phase offset

UR - http://www.scopus.com/inward/record.url?scp=77953716316&partnerID=8YFLogxK

U2 - 10.1109/LPT.2010.2049012

DO - 10.1109/LPT.2010.2049012

M3 - Journal article

SN - 1041-1135

VL - 22

SP - 1018

EP - 1020

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

IS - 14

M1 - 5458064

ER -

Signed and accurate measurement of phase offset in optical DPSK demodulator

Abstract

Keywords

ASJC Scopus subject areas

More information

Other files and links

Fingerprint

Cite this