Signed and accurate measurement of phase offset in optical DPSK demodulator

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Abstract

A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.
Original languageEnglish
Article number5458064
Pages (from-to)1018-1020
Number of pages3
JournalIEEE Photonics Technology Letters
Volume22
Issue number14
DOIs
Publication statusPublished - 24 Jun 2010

Keywords

  • Chromatic dispersion (CD)
  • delay interferometer (DI)
  • delay-tap sampling
  • differential phase-shift keying (DPSK)
  • optical fiber communication
  • performance monitoring
  • phase offset

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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