Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

Chien Wen Huang; Nien Hua Lu; Chih Yen Chen; Cheng Feng Yu; Tsung Sheng Kao; Din Ping Tsai; Pei Wang

doi:10.1117/12.481720

Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

Chien Wen Huang
, Nien Hua Lu
, Chih Yen Chen
, Cheng Feng Yu
, Tsung Sheng Kao
, Din Ping Tsai
, Pei Wang

Research output: Journal article publication › Conference article › Academic research › peer-review

Abstract

Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.

Original language	English
Pages (from-to)	146-150
Number of pages	5
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4923
DOIs	https://doi.org/10.1117/12.481720
Publication status	Published - Oct 2002
Externally published	Yes
Event	Nano-Optics and Nano-Structures 2002 - Shanghai, China Duration: 14 Oct 2002 → 18 Oct 2002

Keywords

Near-field scanning optical microscopy
Short tip
Tapping-mode
Tuning fork

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

More information

10.1117/12.481720

Cite this

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title = "Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy",

abstract = "Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.",

keywords = "Near-field scanning optical microscopy, Short tip, Tapping-mode, Tuning fork",

author = "Huang, \{Chien Wen\} and Lu, \{Nien Hua\} and Chen, \{Chih Yen\} and Yu, \{Cheng Feng\} and Kao, \{Tsung Sheng\} and Tsai, \{Din Ping\} and Pei Wang",

year = "2002",

month = oct,

doi = "10.1117/12.481720",

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pages = "146--150",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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TY - JOUR

T1 - Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

AU - Huang, Chien Wen

AU - Lu, Nien Hua

AU - Chen, Chih Yen

AU - Yu, Cheng Feng

AU - Kao, Tsung Sheng

AU - Tsai, Din Ping

AU - Wang, Pei

PY - 2002/10

Y1 - 2002/10

N2 - Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.

AB - Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.

KW - Near-field scanning optical microscopy

KW - Short tip

KW - Tapping-mode

KW - Tuning fork

UR - https://www.scopus.com/pages/publications/85076919183

U2 - 10.1117/12.481720

DO - 10.1117/12.481720

M3 - Conference article

AN - SCOPUS:85076919183

SN - 0277-786X

VL - 4923

SP - 146

EP - 150

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Nano-Optics and Nano-Structures 2002

Y2 - 14 October 2002 through 18 October 2002

ER -

Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

Abstract

Keywords

ASJC Scopus subject areas

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