Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

Chien Wen Huang; Nien Hua Lu; Chih Yen Chen; Cheng Feng Yu; Tsung Sheng Kao; Din Ping Tsai; Pei Wang

doi:10.1117/12.481720

Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

Chien Wen Huang, Nien Hua Lu, Chih Yen Chen, Cheng Feng Yu, Tsung Sheng Kao, Din Ping Tsai, Pei Wang

Research output: Journal article publication › Conference article › Academic research › peer-review

Abstract

Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.

Original language	English
Pages (from-to)	146-150
Number of pages	5
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4923
DOIs	https://doi.org/10.1117/12.481720
Publication status	Published - Oct 2002
Externally published	Yes
Event	Nano-Optics and Nano-Structures 2002 - Shanghai, China Duration: 14 Oct 2002 → 18 Oct 2002

Keywords

Near-field scanning optical microscopy
Short tip
Tapping-mode
Tuning fork

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

More information

10.1117/12.481720

Cite this

@article{19cc046ec3de4b07b215d73bde2bc45e,

title = "Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy",

abstract = "Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.",

keywords = "Near-field scanning optical microscopy, Short tip, Tapping-mode, Tuning fork",

author = "Huang, {Chien Wen} and Lu, {Nien Hua} and Chen, {Chih Yen} and Yu, {Cheng Feng} and Kao, {Tsung Sheng} and Tsai, {Din Ping} and Pei Wang",

year = "2002",

month = oct,

doi = "10.1117/12.481720",

language = "English",

volume = "4923",

pages = "146--150",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Nano-Optics and Nano-Structures 2002 ; Conference date: 14-10-2002 Through 18-10-2002",

}

TY - JOUR

T1 - Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

AU - Huang, Chien Wen

AU - Lu, Nien Hua

AU - Chen, Chih Yen

AU - Yu, Cheng Feng

AU - Kao, Tsung Sheng

AU - Tsai, Din Ping

AU - Wang, Pei

PY - 2002/10

Y1 - 2002/10

N2 - Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.

AB - Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.

KW - Near-field scanning optical microscopy

KW - Short tip

KW - Tapping-mode

KW - Tuning fork

UR - http://www.scopus.com/inward/record.url?scp=85076919183&partnerID=8YFLogxK

U2 - 10.1117/12.481720

DO - 10.1117/12.481720

M3 - Conference article

AN - SCOPUS:85076919183

SN - 0277-786X

VL - 4923

SP - 146

EP - 150

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Nano-Optics and Nano-Structures 2002

Y2 - 14 October 2002 through 18 October 2002

ER -

Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

Abstract

Keywords

ASJC Scopus subject areas

More information

Other files and links

Fingerprint

Cite this