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Semi-MCDA-Net: A novel class-specific cross-domain fault diagnosis technique under time-varying speed conditions with limited labeled data

Research output: Journal article publication › Journal article › Academic research › peer-review

Abstract

Time-varying rotational speed conditions cause domain shifts in rotating machines, resulting in discrepancies between training and testing datasets, preventing transfer learning models operating at constant speed conditions from detecting invariant features and reducing their generalization efficacy. Moreover, the current transfer learning methods for varying speed scenarios mainly focus on aligning the marginal data distribution while neglecting the influence of class-specific feature alignment on the diagnostic accuracy. To address these limitations, this research develops a novel end-to-end semi-supervised marginal and conditional distribution alignment network (Semi-MCDA-Net) to deal with the issues of fault diagnosis under variable speed working conditions, particularly in the context of insufficient labeled data in the target domain. Our method integrates multi-kernel Maximum Mean Discrepancy (MMD) and Wasserstein distance (WD) to develop a unified domain alignment module, systematically applied across multiple convolutional layers of a shared 1D-CNN. In contrast to conventional transfer learning approaches, the proposed methodology effectively acquires features that are both domain-invariant and class-discriminative, explicitly aligns both marginal and conditional distributions, and thereby generalizes to data in the target domain while improving accuracy near the class decision boundaries. Two case studies are carried out to verify the efficacy and generalizability of Semi-MCDA-Net method.

Original languageEnglish
Article number121072
Number of pages16
JournalMeasurement: Journal of the International Measurement Confederation
Volume272
DOIs
Publication statusPublished - 5 May 2026

Keywords

  • Fault diagnosis
  • Time-varying speed conditions
  • Transfer learning

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering

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