TY - JOUR
T1 - Scanning transmission electron microscopy for advanced characterization of ferroic materials
AU - Cabral, Matthew J.
AU - Chen, Zibin
AU - Liao, Xiaozhou
N1 - Funding information:
This research was partially financially supported by the Australian Research Council (ARC) through project DP190101155, the National Natural Science Youth Foundation of China (Grant No. 12204393), the Research Grant Council of Hong Kong SAR, China (Project No. PolyU25300022), and the Research Office of The Hong Kong Polytechnic University (Project Code: P0042733).
Publisher Copyright:
© The Author(s) 2023.
PY - 2023/10
Y1 - 2023/10
N2 - Scanning Transmission electron microscopy (STEM) technologies have undergone significant advancements in the last two decades. Advancements in aberration-correction technology, ultra-high energy resolution monochromators, and state-of-the-art detectors/cameras have established STEM as an essential tool for investigating material chemistry and structure from the micro to the atomic scale. This characterization technique has been invaluable for understanding and characterizing the origins of ferroic material properties in next-generation advanced materials. Many unique properties of engineering materials, such as ferroelectricity, piezoelectricity, and ferromagnetism, are intricately linked to their atomic-scale composition and structure. STEM enables direct observation of these structural characteristics, establishing a link with macroscopic properties. In this perspective, we provide an overview of the application of advanced STEM techniques in investigating the origin of ferroic material properties, along with discussions on potential opportunities for further utilization of STEM techniques.
AB - Scanning Transmission electron microscopy (STEM) technologies have undergone significant advancements in the last two decades. Advancements in aberration-correction technology, ultra-high energy resolution monochromators, and state-of-the-art detectors/cameras have established STEM as an essential tool for investigating material chemistry and structure from the micro to the atomic scale. This characterization technique has been invaluable for understanding and characterizing the origins of ferroic material properties in next-generation advanced materials. Many unique properties of engineering materials, such as ferroelectricity, piezoelectricity, and ferromagnetism, are intricately linked to their atomic-scale composition and structure. STEM enables direct observation of these structural characteristics, establishing a link with macroscopic properties. In this perspective, we provide an overview of the application of advanced STEM techniques in investigating the origin of ferroic material properties, along with discussions on potential opportunities for further utilization of STEM techniques.
KW - aberration-correction
KW - atomic resolution imaging
KW - ferroic materials
KW - image analysis
KW - materials characterization
KW - Scanning transmission electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=85180211078&partnerID=8YFLogxK
U2 - 10.20517/microstructures.2023.39
DO - 10.20517/microstructures.2023.39
M3 - Journal article
AN - SCOPUS:85180211078
SN - 2770-2995
VL - 3
JO - Microstructures
JF - Microstructures
IS - 4
M1 - 2023040
ER -