RoHs & WEEE : status, compliance, issues and implications

Y.C. Chan, H.S.B. Lam, Kam Chuen Yung, P.W.L. Chau, M. Pecht, P. Beullens, D. Hammond

Research output: Authored / edited bookResearch book or monograph (as author)Academic research

Original languageEnglish
PublisherCentre for Electronic Packaging and Assemblies, Failure Analysis and Reliability Engineering
ISBN (Print)9624422788
Publication statusPublished - 2006

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