RFID-based colored Petri net applied for quality monitoring in manufacturing system

Yaqiong Lv, Ka Man Lee, H. K. Chan, W. H. Ip

Research output: Journal article publicationJournal articleAcademic researchpeer-review

18 Citations (Scopus)

Abstract

Product quality is difficult to be traced and monitored in the distributed manufacturing network. This paper proposes and develops a new RFID-based CPN modeling method where the colored tokens are evolved to color-tagged tokens carrying the product information of real-time status. With this new real-time modeling method, the performance of manufacturing systems such as yield rate and throughput can be realized. In this paper, a case study has been conducted to examine the feasibility and effectiveness of the proposed method. The simulation results show that the new modeling method is able to complete the preliminary real-time quality status analysis of a manufacturing system so as to handle dynamic and stochastic manufacturing network effectively and enable decision making for process improvement.
Original languageEnglish
Pages (from-to)225-236
Number of pages12
JournalInternational Journal of Advanced Manufacturing Technology
Volume60
Issue number1-4
DOIs
Publication statusPublished - 1 Apr 2012

Keywords

  • Colored Petri net modeling
  • Manufacturing process
  • Process quality control
  • Product quality monitoring
  • Real-time analysis
  • RFID

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Software
  • Mechanical Engineering
  • Computer Science Applications
  • Industrial and Manufacturing Engineering

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