Abstract
We use a new imaging method to resolve the nano scale recording bits on phase-change rewritable optical disks. By this method, several kinds of nano scale recording bits on different phase-change optical disks can be clearly imaged without any painstaking or expensive procedures. With the conductive-atomic force microscopy (C-AFM) images of nano scale recording bits on phase-change materials, we can study the properties of phase-change recording layers and the recording bit formation mechanism comprehensively. © 2006 The Japan Society of Applied Physics.
| Original language | English |
|---|---|
| Pages (from-to) | 1431-1434 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 45 |
| Issue number | 2 B |
| DOIs | |
| Publication status | Published - 24 Feb 2006 |
| Externally published | Yes |
Keywords
- Blu-ray disk
- Conductive-atomic force microscopy (C-AFM)
- Digital versatile disk (DVD)
- Phase-change material
- Recording bit
- Rewritable optical disk
ASJC Scopus subject areas
- General Engineering
- General Physics and Astronomy
Fingerprint
Dive into the research topics of 'Resolving nano scale recording bits on phase-change rewritable optical disk'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver