Resolving nano scale recording bits on phase-change rewritable optical disk

S.K. Lin, P. Yang, I.C. Lin, H.W. Hsu, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

11 Citations (Scopus)

Abstract

We use a new imaging method to resolve the nano scale recording bits on phase-change rewritable optical disks. By this method, several kinds of nano scale recording bits on different phase-change optical disks can be clearly imaged without any painstaking or expensive procedures. With the conductive-atomic force microscopy (C-AFM) images of nano scale recording bits on phase-change materials, we can study the properties of phase-change recording layers and the recording bit formation mechanism comprehensively. © 2006 The Japan Society of Applied Physics.
Original languageEnglish
Pages (from-to)1431-1434
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number2 B
DOIs
Publication statusPublished - 24 Feb 2006
Externally publishedYes

Keywords

  • Blu-ray disk
  • Conductive-atomic force microscopy (C-AFM)
  • Digital versatile disk (DVD)
  • Phase-change material
  • Recording bit
  • Rewritable optical disk

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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