Resolving nano scale recording bits on phase-change rewritable optical disk

S.K. Lin; P. Yang; I.C. Lin; H.W. Hsu; Din-ping Tsai

doi:10.1143/JJAP.45.1431

Resolving nano scale recording bits on phase-change rewritable optical disk

S.K. Lin, P. Yang, I.C. Lin, H.W. Hsu, Din-ping Tsai

Research output: Journal article publication › Journal article › Academic research › peer-review

11 Citations (Scopus)

Abstract

We use a new imaging method to resolve the nano scale recording bits on phase-change rewritable optical disks. By this method, several kinds of nano scale recording bits on different phase-change optical disks can be clearly imaged without any painstaking or expensive procedures. With the conductive-atomic force microscopy (C-AFM) images of nano scale recording bits on phase-change materials, we can study the properties of phase-change recording layers and the recording bit formation mechanism comprehensively. © 2006 The Japan Society of Applied Physics.

Original language	English
Pages (from-to)	1431-1434
Number of pages	4
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	45
Issue number	2 B
DOIs	https://doi.org/10.1143/JJAP.45.1431
Publication status	Published - 24 Feb 2006
Externally published	Yes

Keywords

Blu-ray disk
Conductive-atomic force microscopy (C-AFM)
Digital versatile disk (DVD)
Phase-change material
Recording bit
Rewritable optical disk

ASJC Scopus subject areas

General Engineering
General Physics and Astronomy

More information

10.1143/JJAP.45.1431

Cite this

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AU - Yang, P.

AU - Lin, I.C.

AU - Hsu, H.W.

AU - Tsai, Din-ping

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AB - We use a new imaging method to resolve the nano scale recording bits on phase-change rewritable optical disks. By this method, several kinds of nano scale recording bits on different phase-change optical disks can be clearly imaged without any painstaking or expensive procedures. With the conductive-atomic force microscopy (C-AFM) images of nano scale recording bits on phase-change materials, we can study the properties of phase-change recording layers and the recording bit formation mechanism comprehensively. © 2006 The Japan Society of Applied Physics.

KW - Blu-ray disk

KW - Conductive-atomic force microscopy (C-AFM)

KW - Digital versatile disk (DVD)

KW - Phase-change material

KW - Recording bit

KW - Rewritable optical disk

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Resolving nano scale recording bits on phase-change rewritable optical disk

Abstract

Keywords

ASJC Scopus subject areas

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