Resolution in structured illumination microscopy: A probabilistic approach

Michael Geoffrey Somekh, Ken Hsu, Mark C. Pitter

Research output: Journal article publicationJournal articleAcademic researchpeer-review

20 Citations (Scopus)

Abstract

Structured illumination can be employed to extend the lateral resolution of wide-field fluorescence microscopy. Since a structured illumination microscopy image is reconstructed from a series of several acquired images, we develop a modified formulation of the imaging response of the microscope and a probabilistic analysis to assess the resolution performance. We use this model to compare the fluorescence imaging performance of structured illumination techniques to confocal microscopy. Specifically, we examine the trade-off between achievable lateral resolution and signal-to-noise ratio when photon shot noise is dominant. We conclude that for a given photon budget, structured illumination invariably achieves better lateral resolution than confocal microscopy.
Original languageEnglish
Pages (from-to)1319-1329
Number of pages11
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Volume25
Issue number6
DOIs
Publication statusPublished - 1 Jan 2008
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Vision and Pattern Recognition

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