Removing Image Artifacts From Scratched Lens Protectors

Yufei Wang, Renjie Wan, Wenhan Yang, Bihan Wen, Lap Pui Chau, Alex C. Kot

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

A protector is placed in front of the camera lens for mobile devices to avoid damage, while the protector itself can be easily scratched accidentally, especially for plastic ones. The artifacts appear in a wide variety of patterns, making it difficult to see through them clearly. Removing image artifacts from the scratched lens protector is inherently challenging due to the occasional flare artifacts and the co-occurring interference within mixed artifacts. Though different methods have been proposed for some specific distortions, they seldom consider such inherent challenges. In our work, we consider the inherent challenges in a unified framework with two cooperative modules, which facilitate the performance boost of each other. We also collect a new dataset from the real world to facilitate training and evaluation purposes. The experimental results demonstrate that our method outperforms the baselines qualitatively and quantitatively. The code and datasets will be released at https://github.com/wyf0912/flare-removal

Original languageEnglish
Title of host publicationISCAS 2023 - 56th IEEE International Symposium on Circuits and Systems, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665451093
DOIs
Publication statusPublished - Jul 2023
Event56th IEEE International Symposium on Circuits and Systems, ISCAS 2023 - Monterey, United States
Duration: 21 May 202325 May 2023

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2023-May
ISSN (Print)0271-4310

Conference

Conference56th IEEE International Symposium on Circuits and Systems, ISCAS 2023
Country/TerritoryUnited States
CityMonterey
Period21/05/2325/05/23

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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