Abstract
Current patch-based binary fringe patterns are periodic and carry strong harmonic distortion as compared with the ideal sinusoidal fringe patterns, which affects the measuring performance remarkably. In this paper, we propose a framework for generating aperiodic fringe patterns based on optimized patches. The produced fringe patterns can significantly lower the noise floor and suppress the harmonic distortion in the constructed phase map. Accordingly, the achieved depth measuring performance can be significantly improved. Special care is also taken during the optimization of the patches in our framework such that the depth measuring performance is robust to fringe period and defocusing extent.
| Original language | English |
|---|---|
| Pages (from-to) | 139-145 |
| Number of pages | 7 |
| Journal | Optics and Lasers in Engineering |
| Volume | 90 |
| DOIs | |
| Publication status | Published - 1 Mar 2017 |
Keywords
- 3D shape measurement
- Binary defocusing
- Dithering
- Fringe analysis
- Optimization
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Mechanical Engineering
- Electrical and Electronic Engineering