Reliability study and failure analysis of fine pitch solder-bumped flip chip on low-cost flexible substrate without using stiffener

Guo Wei Xiao, Philip Ching Ho Chan, Ricky S.W. Lee, Matthew M.F. Yuen

Research output: Journal article publicationConference articleAcademic researchpeer-review

3 Citations (Scopus)

Abstract

In flip chip on flex (FCOF) technology, the flexible substrate and the assembly process are very essential for the reliability of solder joints. In the research, fine-pitch solder-bumped chips with various chip sizes were assembled on the flexible substrates using FCOF technology. The five types of layout designs were evaluated for their effects on the assembly process and reliability of FCOF technology. It was found that appropriate substrate layout designs provided more accurate control of the wetting area because they minimized the misalignment between the copper pad and the solder mask opening. The concept of wetting area error ratio is introduced to evaluate the variation of the wetting area on the various layout designs. The shapes of solder joints formed are also related to the flex designs. Die shear test was performed for the samples of FCOF without underfill materials to study the adhesion strength of the copper pad, the solder mask and the base layer. The rafted samples after thermal cycling and HAST were analyzed using SAM, X-ray imaging system, cross-sectioning, scanning electron microscopy (SEM).
Original languageEnglish
Pages (from-to)112-118
Number of pages7
JournalProceedings - Electronic Components and Technology Conference
Publication statusPublished - 1 Jan 2002
Externally publishedYes
Event52nd Electronic Components and Technology Conference - San Diego, CA, United States
Duration: 28 May 200231 May 2002

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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