Reflectometry measuring refractive index and thickness of polymer samples simultaneously

Yi Ping Wang, Dong Ning Wang, Wei Jin, Jian Ping Chen, Xin Wan Li, Jun He Zhou

Research output: Journal article publicationJournal articleAcademic researchpeer-review

5 Citations (Scopus)


It is proposed and demonstrated that a novel reflectometry based on the Michelson interference measures simultaneously group refractive index and thickness of polymer samples. Such a reflectometry is a contactless measurement technique, and no damage occurs to the sample measured. Moreover, the measurement error of refractive index decreases linearly with the increasing measured sample's thickness. The ingenious planar polymer sample fabricated acts as not only the measured sample but also the fixed mirror that is necessary in other Michelson interference systems, which simplify the measurement configuration. Our reflectometry exhibits some advantages, such as simple measurement configuration, straightforward principle, easy operation, contactless measurement and high measurement precision.
Original languageEnglish
Pages (from-to)1845-1851
Number of pages7
JournalJournal of Modern Optics
Issue number13
Publication statusPublished - 10 Sept 2006

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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