Recrystallization of amorphized Si during micro-grinding of RB-SiC/Si composites

Quanli Zhang, Suet To, Qingliang Zhao, Bing Guo

Research output: Journal article publicationJournal articleAcademic researchpeer-review

7 Citations (Scopus)


X-ray diffraction (XRD) was performed to investigate the phase transformation of Reaction-Bonded SiC/Si composites (RB-SiC/Si) induced by micro-grinding. The results showed that amorphization (High Pressure Phase Transformation, HPPT) occurred for both SiC and Si phases in the outmost layer, and the amorphization degree dropped as the feed rate changed from 3 mm/min to 0.1 mm/min. Moreover, we firstly found that recrystallization of amorphized Si appeared in preferred orientation under grinding. Specifically, preferred Si(111) growth occurred at a lower feed rate attributed to the more obvious annealing effect, while preferred Si(220) recrystallization developed at higher feed rate due to the greater strain. Theoretical analysis based on the crystal structure of Si yield good consistence.
Original languageEnglish
Pages (from-to)48-51
Number of pages4
JournalMaterials Letters
Publication statusPublished - 1 Jun 2016


  • Micro-grinding
  • Phase transformation
  • Recrystallization
  • Silicon
  • X-ray diffraction

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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