Rapid identification of structural properties based on mass response method

K. Zhou, J. Tang, R. Christenson

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

1 Citation (Scopus)

Abstract

This paper presents a vibration-based methodology of rapid identification of structural properties that can be utilized to assess the integrity of certain continuous structures after hazardous events. The methodology is built upon existing hardware such as shaker force generator and accelerometers that are both portable and convenient to use. The key idea is to use a known added mass that is placed at a certain location on the structure, and measure the modal information before and after the mass is added. Based on the assumed mode-based discretization, inverse identification of structural parameters can then be facilitated with the two sets of modal information, even without the a priori model/knowledge of the mass properties of the underlying structure. Case studies are carried out to demonstrate the feasibility in the identification of column stiffness in a simple emulated bridge structure.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
DOIs
Publication statusPublished - 2012
Externally publishedYes
EventNondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2012 - San Diego, CA, United States
Duration: 12 Mar 201215 Mar 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8347
ISSN (Print)0277-786X

Conference

ConferenceNondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2012
Country/TerritoryUnited States
CitySan Diego, CA
Period12/03/1215/03/12

Keywords

  • Frequency response measurement
  • Inverse identification
  • Mass response method
  • Structural identification

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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