Quality prediction of microchip encapulation using optimal neural networks

K.W. Tong, Chun Kit Kwong, Kai Ming Yu

Research output: Unpublished conference presentation (presented paper, abstract, poster)Conference presentation (not published in journal/proceeding/book)Academic research

Original languageEnglish
Number of pages6
Publication statusPublished - 2002
EventInternational Conference on Quality and Reliability -
Duration: 1 Jan 2002 → …


ConferenceInternational Conference on Quality and Reliability
Period1/01/02 → …

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