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PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components with a Robotic Line Scanner

Research output: Journal article publicationJournal articleAcademic researchpeer-review

Abstract

The automatic inspection of surface defects is an essential task for quality control in the computers, communications, and consumer (3C) electronics industry. Traditional inspection mechanisms (i.e., line-scan sensors) have a limited field of view (FOV), thus prompting the necessity for a multifaceted robotic inspection system capable of comprehensive scanning. Optimally selecting the robot's viewpoints and planning a path is regarded as coverage path planning (CPP), a problem that enables inspecting the object's complete surface while reducing the scanning time and avoiding misdetection of defects. In this article, we present a new approach for robotic line scanners to detect surface defects of 3C free-form objects automatically. A two-stage region segmentation method defines the local scanning based on the random sample consensus (RANSAC) and K-means clustering to improve the inspection coverage. The proposed method also consists of an adaptive region-of-interest (ROI) algorithm to define the local scanning paths. Besides, a particle swarm optimization (PSO)-based method is used for global inspection path generation to minimize the inspection time. The developed method is validated by simulation-based and experimental studies on various free-form workpieces, and its performance is compared with that of two state-of-the-art solutions. The reported results demonstrate the feasibility and effectiveness of our proposed method.

Original languageEnglish
Article number7505012
Number of pages12
JournalIEEE Transactions on Instrumentation and Measurement
Volume74
DOIs
Publication statusPublished - Mar 2025

Keywords

  • Computers
  • and consumer (3C) components
  • communications
  • coverage path planning (CPP)
  • line-scan sensor
  • robotic inspection
  • surface inspection

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering

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