PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components with a Robotic Line Scanner

Hongpeng Chen, Shengzeng Huo, Muhammad Muddassir, Hoi Yin Lee, Yuli Liu, Junxi Li, Anqing Duan, Pai Zheng, David Navarro-Alarcon

Research output: Journal article publicationJournal articleAcademic researchpeer-review

Abstract

The automatic inspection of surface defects is an essential task for quality control in the computers, communications, and consumer electronics (3C) industry. Traditional inspection mechanisms (viz. line-scan sensors) have a limited field of view, thus, prompting the necessity for a multifaceted robotic inspection system capable of comprehensive scanning. Optimally selecting the robot's viewpoints and planning a path is regarded as coverage path planning (CPP), a problem that enables inspecting the object's complete surface while reducing the scanning time and avoiding misdetection of defects. In this paper, we present a new approach for robotic line scanners to detect surface defects of 3C free-form objects automatically. A two-stage region segmentation method defines the local scanning based on the random sample consensus (RANSAC) and K-means clustering to improve the inspection coverage. The proposed method also consists of an adaptive region-of-interest (ROI) algorithm to define the local scanning paths. Besides, a Particle Swarm Optimization (PSO)-based method is used for global inspection path generation to minimize the inspection time. The developed method is validated by simulation-based and experimental studies on various free-form workpieces, and its performance is compared with that of two state-of-the-art solutions. The reported results demonstrate the feasibility and effectiveness of our proposed method.

Original languageEnglish
JournalIEEE Transactions on Instrumentation and Measurement
DOIs
Publication statusAccepted/In press - 2025

Keywords

  • 3C components
  • Coverage path planning (CPP)
  • Line-scan sensor
  • Robotic inspection
  • Surface inspection

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering

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