PSF analysis of reflective objectives based nonlinear 4Pi tomography

Chenglong Hao, Changyuan Yu, Hao Li, Xia Yu, Ying Zhang

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

We proposed the nonlinear (second harmonic generation) 4Pi type C microscope using reflective objective in mid-infrared region. It provided a potential and practical solution of high resolution, deep penetration tomography in bio-medical application.
Original languageEnglish
Title of host publicationProceedings of Frontiers in Optics 2015, FIO 2015
PublisherOSA - The Optical Society
ISBN (Electronic)9781943580033
Publication statusPublished - 1 Jan 2015
Externally publishedYes
EventFrontiers in Optics 2015, FIO 2015 - San Jose, United States
Duration: 18 Oct 201522 Oct 2015

Conference

ConferenceFrontiers in Optics 2015, FIO 2015
Country/TerritoryUnited States
CitySan Jose
Period18/10/1522/10/15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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