Process induced magnetic sensitivity variation in sectorial split-drain magnetic field-effect transistor

W.S. Tam; S.L. Siu; C.W. Kok; Chi Wah Leung; P.W.T. Pont; H. Wong

Process induced magnetic sensitivity variation in sectorial split-drain magnetic field-effect transistor

W.S. Tam
, S.L. Siu
, C.W. Kok
, Chi Wah Leung
, P.W.T. Pont
, H. Wong

The Hong Kong Polytechnic University

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

Original language	English
Publication status	Published - 2014
Event	International Symposium on Next-Generation Electronics [ISNE] - Duration: 1 Jan 2014 → …

Conference

Conference	International Symposium on Next-Generation Electronics [ISNE]
Period	1/01/14 → …

Cite this

@conference{533d5ee651e74af68f9667d56a119026,

title = "Process induced magnetic sensitivity variation in sectorial split-drain magnetic field-effect transistor",

author = "W.S. Tam and S.L. Siu and C.W. Kok and Leung, \{Chi Wah\} and P.W.T. Pont and H. Wong",

year = "2014",

language = "English",

note = "International Symposium on Next-Generation Electronics [ISNE] ; Conference date: 01-01-2014",

}

Process induced magnetic sensitivity variation in sectorial split-drain magnetic field-effect transistor. / Tam, W.S.; Siu, S.L.; Kok, C.W. et al.
2014. Paper presented at International Symposium on Next-Generation Electronics [ISNE].

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

TY - CONF

T1 - Process induced magnetic sensitivity variation in sectorial split-drain magnetic field-effect transistor

AU - Tam, W.S.

AU - Siu, S.L.

AU - Kok, C.W.

AU - Leung, Chi Wah

AU - Pont, P.W.T.

AU - Wong, H.

PY - 2014

Y1 - 2014

M3 - Conference presentation (not published in journal/proceeding/book)

T2 - International Symposium on Next-Generation Electronics [ISNE]

Y2 - 1 January 2014

ER -