Preparation of BaTiO3 thin films of micrometer range thickness by pulsed laser deposition on (001)LaAlO3 substrates

Kai Ming Yeung, Chee Leung Mak, Kin Hung Wong, Geoffrey Kin Hung Pang

Research output: Journal article publicationJournal articleAcademic researchpeer-review

4 Citations (Scopus)

Abstract

Thick BaTiO3 (BTO) films of up to 2.5 μm thickness have been deposited on (001)LaAlO3 (LAO) substrates using pulsed laser deposition (PLD). The evolution of structural properties with film thickness was investigated by X-ray diffraction (XRD) analysis, Raman spectroscopy, scanning electron microscopy (SEM) and atomic force microscopy (AFM). XRD and Raman analyses show that BTO films, with a thickness of up to 2.5 μm, are all c-oriented and epitaxially grown on LAO. No impurity (non-BTO) phase in the films has been detected. It is noted that the crystalline quality of the BTO films, as revealed by the narrowing of the full width at half maximum (FWHM) of the rocking curves, increases with film thickness. Moreover, SEM and AFM results demonstrate that large grain size and a rough surface are observed in thick films. On the basis of these results, it can be concluded that growing thick BTO films by PLD can produce improved crystalline qualities but decreased surface smoothness due to enhanced columnar grain growth.
Original languageEnglish
Pages (from-to)6292-6296
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume43
Issue number9 A
DOIs
Publication statusPublished - 1 Sep 2004

Keywords

  • BTO thick films
  • PLD
  • Raman spectroscopy
  • XRD

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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