Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy

S. G. Lu; Haydn Chen; Chee Leung Mak; K. H. Wong; H. L.W. Chan; C. L. Choy; J. J. Xu; San-Qiang Shi

Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy

S. G. Lu, Haydn Chen, Chee Leung Mak, K. H. Wong, H. L.W. Chan, C. L. Choy, J. J. Xu, San-Qiang Shi

Research output: Journal article publication › Journal article › Academic research › peer-review

Abstract

Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3(x = 0.75,0.8,0.9,1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3(LSMO)/LaAlO3(LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperature dependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric - paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.

Original language	English
Pages (from-to)	1903-1908
Number of pages	6
Journal	Key Engineering Materials
Volume	280-283
Issue number	II
Publication status	Published - 1 Dec 2005

Keywords

Barium strontium titanate
Scanning force microscopy
Thin film

ASJC Scopus subject areas

General Materials Science
Mechanics of Materials
Mechanical Engineering

Cite this

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title = "Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy",

abstract = "Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3(x = 0.75,0.8,0.9,1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3(LSMO)/LaAlO3(LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperature dependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric - paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.",

keywords = "Barium strontium titanate, Scanning force microscopy, Thin film",

author = "Lu, {S. G.} and Haydn Chen and Mak, {Chee Leung} and Wong, {K. H.} and Chan, {H. L.W.} and Choy, {C. L.} and Xu, {J. J.} and San-Qiang Shi",

year = "2005",

month = dec,

day = "1",

language = "English",

volume = "280-283",

pages = "1903--1908",

journal = "Key Engineering Materials",

issn = "1013-9826",

publisher = "Trans Tech Publications Ltd",

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TY - JOUR

T1 - Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy

AU - Lu, S. G.

AU - Chen, Haydn

AU - Mak, Chee Leung

AU - Wong, K. H.

AU - Chan, H. L.W.

AU - Choy, C. L.

AU - Xu, J. J.

AU - Shi, San-Qiang

PY - 2005/12/1

Y1 - 2005/12/1

N2 - Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3(x = 0.75,0.8,0.9,1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3(LSMO)/LaAlO3(LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperature dependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric - paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.

AB - Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3(x = 0.75,0.8,0.9,1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3(LSMO)/LaAlO3(LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperature dependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric - paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.

KW - Barium strontium titanate

KW - Scanning force microscopy

KW - Thin film

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M3 - Journal article

SN - 1013-9826

VL - 280-283

SP - 1903

EP - 1908

JO - Key Engineering Materials

JF - Key Engineering Materials

IS - II

ER -

Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy

Abstract

Keywords

ASJC Scopus subject areas

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