Abstract
A PMMA-based reactive ion etching (RIE) process for the fabrication of high aspect ratio microstructures is described in this paper. Although the resolution of this process is lower than that of the LIGA process, this process provides a simpler way to get higher height and high aspect ratio microstructures. In the process, Ni material is selected as mask and patterned using photochemical etching. The self-bias, which is determined by different etching parameters such as etching power and gas pressure etc, is very important. By optimizing the etching parameters, vertical PMMA profile and 5:1 aspect ratio structures can be obtained. The micro-mask effect and high power etching damage are also demonstrated and discussed in this paper.
Original language | English |
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Pages (from-to) | 784-791 |
Number of pages | 8 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4755 |
DOIs | |
Publication status | Published - Apr 2002 |
Externally published | Yes |
Keywords
- High aspect ratio
- MEMS and Microstructures
- PMMA
- RIE
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering