Piezoresponse and ferroelectric properties of lead-free [Bi0.5(Na0.7K0.2Li0.1)0.5]Ti O3thin films by pulsed laser deposition

D. Y. Wang, D. M. Lin, K. S. Wong, Kin Wing Kwok, J. Y. Dai, H. L.W. Chan

Research output: Journal article publicationJournal articleAcademic researchpeer-review

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Abstract

Polycrystalline lead-free piezoelectric [Bi0.5(Na0.7K0.2Li0.1)0.5]Ti O3(BNKLT) thin films were grown on PtTiSi O2 Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization Prof 13.9 μC cm2and a coercive field Ec of 10.2 MVm. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d33,f of the BNKLT thin films was about 64 pmV.
Original languageEnglish
Article number222909
JournalApplied Physics Letters
Volume92
Issue number22
DOIs
Publication statusPublished - 13 Jun 2008

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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