Piezoresponse and ferroelectric properties of lead-free [Bi0.5(Na0.7K0.2Li0.1)0.5]Ti O3thin films by pulsed laser deposition

D. Y. Wang; D. M. Lin; K. S. Wong; Kin Wing Kwok; J. Y. Dai; H. L.W. Chan

doi:10.1063/1.2938364

Piezoresponse and ferroelectric properties of lead-free [Bi_0.5(Na_0.7K_0.2Li_0.1)_0.5]Ti O₃thin films by pulsed laser deposition

D. Y. Wang, D. M. Lin, K. S. Wong, Kin Wing Kwok, J. Y. Dai, H. L.W. Chan

Research output: Journal article publication › Journal article › Academic research › peer-review

61 Citations (Scopus)

Abstract

Polycrystalline lead-free piezoelectric [Bi0.5(Na0.7K0.2Li0.1)0.5]Ti O3(BNKLT) thin films were grown on PtTiSi O2 Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization Prof 13.9 μC cm2and a coercive field Ec of 10.2 MVm. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d33,f of the BNKLT thin films was about 64 pmV.

Original language	English
Article number	222909
Journal	Applied Physics Letters
Volume	92
Issue number	22
DOIs	https://doi.org/10.1063/1.2938364
Publication status	Published - 13 Jun 2008

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2938364

http://hdl.handle.net/10397/455

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title = "Piezoresponse and ferroelectric properties of lead-free [Bi0.5(Na0.7K0.2Li0.1)0.5]Ti O3thin films by pulsed laser deposition",

abstract = "Polycrystalline lead-free piezoelectric [Bi0.5(Na0.7K0.2Li0.1)0.5]Ti O3(BNKLT) thin films were grown on PtTiSi O2 Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization Prof 13.9 μC cm2and a coercive field Ec of 10.2 MVm. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d33,f of the BNKLT thin films was about 64 pmV.",

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AU - Wang, D. Y.

AU - Lin, D. M.

AU - Wong, K. S.

AU - Kwok, Kin Wing

AU - Dai, J. Y.

AU - Chan, H. L.W.

PY - 2008/6/13

Y1 - 2008/6/13

N2 - Polycrystalline lead-free piezoelectric [Bi0.5(Na0.7K0.2Li0.1)0.5]Ti O3(BNKLT) thin films were grown on PtTiSi O2 Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization Prof 13.9 μC cm2and a coercive field Ec of 10.2 MVm. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d33,f of the BNKLT thin films was about 64 pmV.

AB - Polycrystalline lead-free piezoelectric [Bi0.5(Na0.7K0.2Li0.1)0.5]Ti O3(BNKLT) thin films were grown on PtTiSi O2 Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization Prof 13.9 μC cm2and a coercive field Ec of 10.2 MVm. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d33,f of the BNKLT thin films was about 64 pmV.

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Piezoresponse and ferroelectric properties of lead-free [Bi_0.5(Na_0.7K_0.2Li_0.1)_0.5]Ti O₃thin films by pulsed laser deposition

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