Physics-of-failure-based prognostics and health management for high-power white light-emitting diode lighting

Jiajie Fan, Kam Chuen Yung, Michael Pecht

Research output: Journal article publicationJournal articleAcademic researchpeer-review

82 Citations (Scopus)

Abstract

Recently, high-power white light-emitting diodes (LEDs) have attracted much attention due to their versatility in applications and to the increasing market demand for them. So great attention has been focused on producing highly reliable LED lighting. How to accurately predict the reliability of LED lighting is emerging as one of the key issues in this field. Physics-of-failure-based prognostics and health management (PoF-based PHM) is an approach that utilizes knowledge of a product's life cycle loading and failure mechanisms to design for and assess reliability. In this paper, after analyzing the materials and geometries for high-power white LED lighting at all levels, i.e., chips, packages and systems, failure modes, mechanisms and effects analysis (FMMEA) was used in the PoF-based PHM approach to identify and rank the potential failures emerging from the design process. The second step in this paper was to establish the appropriate PoF-based damage models for identified failure mechanisms that carry a high risk.
Original languageEnglish
Article number5773483
Pages (from-to)407-416
Number of pages10
JournalIEEE Transactions on Device and Materials Reliability
Volume11
Issue number3
DOIs
Publication statusPublished - 1 Sep 2011

Keywords

  • Light-emitting diode (LED) lighting
  • physics-of-failure
  • prognostics and health management (PHM)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this