Photon scanning tunneling microscope study of optical waveguides

Din-ping Tsai; H.E. Jackson; R.C. Reddick; S.H. Sharp; R.J. Warmack

doi:10.1063/1.103160

Photon scanning tunneling microscope study of optical waveguides

Din-ping Tsai, H.E. Jackson, R.C. Reddick, S.H. Sharp, R.J. Warmack

Research output: Journal article publication › Journal article › Academic research › peer-review

69 Citations (Scopus)

Abstract

A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.

Original language	English
Pages (from-to)	1515-1517
Number of pages	3
Journal	Applied Physics Letters
Volume	56
Issue number	16
DOIs	https://doi.org/10.1063/1.103160
Publication status	Published - 1 Dec 1990
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

More information

10.1063/1.103160

Cite this

@article{48e1dc131a6c4f24b14f858402effc48,

title = "Photon scanning tunneling microscope study of optical waveguides",

abstract = "A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.",

author = "Din-ping Tsai and H.E. Jackson and R.C. Reddick and S.H. Sharp and R.J. Warmack",

year = "1990",

month = dec,

day = "1",

doi = "10.1063/1.103160",

language = "English",

volume = "56",

pages = "1515--1517",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "16",

}

TY - JOUR

T1 - Photon scanning tunneling microscope study of optical waveguides

AU - Tsai, Din-ping

AU - Jackson, H.E.

AU - Reddick, R.C.

AU - Sharp, S.H.

AU - Warmack, R.J.

PY - 1990/12/1

Y1 - 1990/12/1

N2 - A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.

AB - A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.

UR - http://www.scopus.com/inward/record.url?scp=0012963046&partnerID=8YFLogxK

U2 - 10.1063/1.103160

DO - 10.1063/1.103160

M3 - Journal article

SN - 0003-6951

VL - 56

SP - 1515

EP - 1517

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 16

ER -

Photon scanning tunneling microscope study of optical waveguides

Abstract

ASJC Scopus subject areas

More information

Other files and links

Fingerprint

Cite this