Photon scanning tunneling microscope study of optical waveguides

Din-ping Tsai, H.E. Jackson, R.C. Reddick, S.H. Sharp, R.J. Warmack

Research output: Journal article publicationJournal articleAcademic researchpeer-review

64 Citations (Scopus)

Abstract

A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.
Original languageEnglish
Pages (from-to)1515-1517
Number of pages3
JournalApplied Physics Letters
Volume56
Issue number16
DOIs
Publication statusPublished - 1 Dec 1990
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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