Phase transitions and optical characterization of lead-free piezoelectric (K0.5Na0.5)0.96Li0.04(Nb0.8Ta0.2)O3thin films

Y. B. Yao, H. T. Chan, Chee Leung Mak, K. H. Wong

Research output: Journal article publicationJournal articleAcademic researchpeer-review

15 Citations (Scopus)

Abstract

Lead-free piezoelectric thin films, (K0.5Na0.5)0.96Li0.04(Nb0.8Ta0.2)O3, were epitaxially grown on MgO(001) and Nb-doped SrTiO3(001) substrates using pulsed laser deposition. The optimum deposition temperature was found to be 600 C. Two types of in-plane orientations were observed in the films depending on the substrates used. The transmittance and photoluminescence spectra as well as the dielectric and ferroelectric properties of the films were measured. The measured band-gap energy was found to be decreased with the deposition temperature. The dielectric constant decreased from 550 to 300 as the frequency increased from 100 Hz to 1 MHz. The measured remnant polarization and coercive field were 4 μC/cm2and 68 kV/cm, respectively. The phase transitions of the films were studied by Raman spectroscopy. Two distinct anomalies originating from the cubic-to-tetragonal (TC-T~ 300 C) and tetragonal-to-orthorhombic (TT-O~ 120 C) phase transitions were observed. Our results show that Raman spectroscopy is a powerful tool in identifying the phase transitions in ferroelectric thin films.
Original languageEnglish
Pages (from-to)156-162
Number of pages7
JournalThin Solid Films
Volume537
DOIs
Publication statusPublished - 30 Jun 2013

Keywords

  • KNN-LT
  • Lead-free piezoelectric
  • Optical properties
  • Phase transition
  • Pulse laser deposition
  • Raman spectroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this