Abstract
Palmprint is a unique and reliable biometric characteristic with high usability. With the increasing demand of automatic palmprint authentication systems, the development of accurate and robust palmprint verification algorithms has been attracting a lot of interests. The relative translation, rotation and distortion between two palmprint images will introduce much error in palmprint matching. However, an accurate registration of palmprint images is too time-consuming. In this paper, we propose a modified complex wavelet structural similarity index (CW-SSIM) to compute the matching score and hence identify the input palmprint. Since CW-SSIM is robust to translation, small rotation and distortion, a fast rough alignment of palmprint images is sufficient. CW-SSIM is also insensitive to luminance and contrast changes. Our experimental results show that the proposed scheme outperfonns the state-of-the-art methods by achieving a higher genuine acceptance rate and a lower false acceptance rate simultaneously.
Original language | English |
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Title of host publication | 2007 IEEE International Conference on Image Processing, ICIP 2007 Proceedings |
Volume | 2 |
DOIs | |
Publication status | Published - 1 Dec 2007 |
Event | 14th IEEE International Conference on Image Processing, ICIP 2007 - San Antonio, TX, United States Duration: 16 Sept 2007 → 19 Sept 2007 |
Conference
Conference | 14th IEEE International Conference on Image Processing, ICIP 2007 |
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Country/Territory | United States |
City | San Antonio, TX |
Period | 16/09/07 → 19/09/07 |
Keywords
- Biometrics
- Complex wavelet
- Palmprint
- Similarity measurement
- Transform
ASJC Scopus subject areas
- General Engineering