Optimal thresholds for multiwavelet shrinkage

Tai Chiu Hsung, Pak Kong Lun

Research output: Journal article publicationJournal articleAcademic researchpeer-review

6 Citations (Scopus)

Abstract

Optimal threshold selection for multiwavelet denoising using multivariate shrinkage was discussed. A new risk estimator for each decomposition level based on the principle of Stein's unbiased risk estimator was presented. It was found that multiwavelet denoising with multivariate shrinkage gives consistently better results than using wavelet shrinkage.
Original languageEnglish
Pages (from-to)473-474
Number of pages2
JournalElectronics Letters
Volume39
Issue number5
DOIs
Publication statusPublished - 6 Mar 2003

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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