Optimal thresholds for multiwavelet shrinkage

Tai Chiu Hsung; Pak Kong Lun

doi:10.1049/el:20030328

Optimal thresholds for multiwavelet shrinkage

Tai Chiu Hsung, Pak Kong Lun

The Hong Kong Polytechnic University

Research output: Journal article publication › Journal article › Academic research › peer-review

6 Citations (Scopus)

Abstract

Optimal threshold selection for multiwavelet denoising using multivariate shrinkage was discussed. A new risk estimator for each decomposition level based on the principle of Stein's unbiased risk estimator was presented. It was found that multiwavelet denoising with multivariate shrinkage gives consistently better results than using wavelet shrinkage.

Original language	English
Pages (from-to)	473-474
Number of pages	2
Journal	Electronics Letters
Volume	39
Issue number	5
DOIs	https://doi.org/10.1049/el:20030328
Publication status	Published - 6 Mar 2003

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1049/el:20030328

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Optimal thresholds for multiwavelet shrinkage

Abstract

ASJC Scopus subject areas

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