Optical properties of Ba0.5Sr0.5TiO3thin films grown on MgO substrates by pulsed laser deposition

D. Y. Wang; Chee Leung Mak; K. H. Wong; H. L W Chan; C. L. Choy

doi:10.1016/j.ceramint.2003.12.136

Optical properties of Ba_0.5Sr_0.5TiO₃thin films grown on MgO substrates by pulsed laser deposition

D. Y. Wang, Chee Leung Mak, K. H. Wong, H. L W Chan, C. L. Choy

Research output: Journal article publication › Conference article › Academic research › peer-review

34 Citations (Scopus)

Abstract

Barium strontium titanate (Ba0.5Sr0.5TiO3or BST (50/50)) thin films were grown on MgO(100) substrates using pulsed laser deposition (PLD). The surface morphology of the thin films was observed using a scanning probe microscope and the grain size was found to be around 100-150nm. The surface roughness is below 5nm for a 250nm thick film. X-ray diffraction (XRD) results revealed that the BST thin films were epitaxially grown on the MgO(100) substrates. Optical transmittance and electro-optic (E-O) properties of the BST thin films were measured using a phase modulation detection method. The BST/MgO configuration was highly transparent in the visible region. The BST film exhibited a predominantly quadratic E-O behavior and the quadratic E-O coefficient was found to be 0.42×10-17m2/V2.

Original language	English
Pages (from-to)	1745-1748
Number of pages	4
Journal	Ceramics International
Volume	30
Issue number	7
DOIs	https://doi.org/10.1016/j.ceramint.2003.12.136
Publication status	Published - 7 Sept 2004
Event	3rd Asian Meeting on Electroceramics - Singapore, Singapore Duration: 7 Dec 2003 → 11 Dec 2003

Keywords

BST thin films
Electro-optic
Ellipsometer

ASJC Scopus subject areas

Ceramics and Composites

More information

10.1016/j.ceramint.2003.12.136

Cite this

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title = "Optical properties of Ba0.5Sr0.5TiO3thin films grown on MgO substrates by pulsed laser deposition",

abstract = "Barium strontium titanate (Ba0.5Sr0.5TiO3or BST (50/50)) thin films were grown on MgO(100) substrates using pulsed laser deposition (PLD). The surface morphology of the thin films was observed using a scanning probe microscope and the grain size was found to be around 100-150nm. The surface roughness is below 5nm for a 250nm thick film. X-ray diffraction (XRD) results revealed that the BST thin films were epitaxially grown on the MgO(100) substrates. Optical transmittance and electro-optic (E-O) properties of the BST thin films were measured using a phase modulation detection method. The BST/MgO configuration was highly transparent in the visible region. The BST film exhibited a predominantly quadratic E-O behavior and the quadratic E-O coefficient was found to be 0.42×10-17m2/V2.",

keywords = "BST thin films, Electro-optic, Ellipsometer",

author = "Wang, {D. Y.} and Mak, {Chee Leung} and Wong, {K. H.} and Chan, {H. L W} and Choy, {C. L.}",

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TY - JOUR

T1 - Optical properties of Ba0.5Sr0.5TiO3thin films grown on MgO substrates by pulsed laser deposition

AU - Wang, D. Y.

AU - Mak, Chee Leung

AU - Wong, K. H.

AU - Chan, H. L W

AU - Choy, C. L.

PY - 2004/9/7

Y1 - 2004/9/7

N2 - Barium strontium titanate (Ba0.5Sr0.5TiO3or BST (50/50)) thin films were grown on MgO(100) substrates using pulsed laser deposition (PLD). The surface morphology of the thin films was observed using a scanning probe microscope and the grain size was found to be around 100-150nm. The surface roughness is below 5nm for a 250nm thick film. X-ray diffraction (XRD) results revealed that the BST thin films were epitaxially grown on the MgO(100) substrates. Optical transmittance and electro-optic (E-O) properties of the BST thin films were measured using a phase modulation detection method. The BST/MgO configuration was highly transparent in the visible region. The BST film exhibited a predominantly quadratic E-O behavior and the quadratic E-O coefficient was found to be 0.42×10-17m2/V2.

AB - Barium strontium titanate (Ba0.5Sr0.5TiO3or BST (50/50)) thin films were grown on MgO(100) substrates using pulsed laser deposition (PLD). The surface morphology of the thin films was observed using a scanning probe microscope and the grain size was found to be around 100-150nm. The surface roughness is below 5nm for a 250nm thick film. X-ray diffraction (XRD) results revealed that the BST thin films were epitaxially grown on the MgO(100) substrates. Optical transmittance and electro-optic (E-O) properties of the BST thin films were measured using a phase modulation detection method. The BST/MgO configuration was highly transparent in the visible region. The BST film exhibited a predominantly quadratic E-O behavior and the quadratic E-O coefficient was found to be 0.42×10-17m2/V2.

KW - BST thin films

KW - Electro-optic

KW - Ellipsometer

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VL - 30

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EP - 1748

JO - Ceramics International

JF - Ceramics International

IS - 7

T2 - 3rd Asian Meeting on Electroceramics

Y2 - 7 December 2003 through 11 December 2003

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