On optical phase shift profilometry based on dual tree complex wavelet transform

Tai Chiu Hsung, Pak Kong Lun

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

5 Citations (Scopus)


In optical phase shift profilometry, parallel fringe patterns are projected onto an object and the deformed fringes are captured using a digital camera. It is of particular interest because it enables reconstruction of the 3D shape of the object using just a few image captures, which facilitates real time applications. However, when using the approach in real life environment, it is noticed that the noise in the captured images can greatly affect the reconstruction quality. In this paper, we firstly analyze why the noisy fringe images can best be analyzed using the oriented 2D dual tree complex wavelet transform. We then suggest an effective yet simple method for enhancing the noisy fringe images. Both the simulation and experiment results show that the new approach can give good performance in reconstruction with fringe images even at high noise level.
Original languageEnglish
Title of host publication2010 IEEE International Conference on Image Processing, ICIP 2010 - Proceedings
Number of pages4
Publication statusPublished - 1 Dec 2010
Event2010 17th IEEE International Conference on Image Processing, ICIP 2010 - Hong Kong, Hong Kong
Duration: 26 Sep 201029 Sep 2010


Conference2010 17th IEEE International Conference on Image Processing, ICIP 2010
Country/TerritoryHong Kong
CityHong Kong


  • Dual tree complex wavelet transform
  • Phase unwrapping
  • Profilometry

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition
  • Signal Processing

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