Objective measurement of the `fit' of an apparel

Keng Po Roger Ng, C. K. Chan, T. Y. Pong, Raymond Au

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

This article first presents a framework of quantitative measurement of the `fit' of a garment. Then the solution to the inverse problem of apparel design with a given `fit' is illustrated. The first index is the Linear Index, which measures the difference in the linear measurements. The second index is the Cross-sectional Index, which measures the area between the garment and the dummy. The third index is the Volume Index, which measures the volume between the garment and the dummy. Finally, the fourth measurement is the Signature Cure, which is also referred as the `fit-spectrum diagram'. This diagram presents the cross-section index along the height axis. The Signature Curve is the relationship between the cross-sectional indices and the height. This framework can be applied to any computer aided model of the garment. However, the inverse problem of designing a garment with a given Signature Curve is non-trivial. The solution is illustrated on the Algebraic Mannequin, which is a unified 3D model of the dummy and the garment, developed by the authors. It contains all the crucial information for the pattern design process. Finally, the proof of the computation is presented.
Original languageEnglish
Title of host publicationWorld Conference of the Textile Institute, Proceedings
PublisherTextile Inst
Pages340
Number of pages1
Publication statusPublished - 1 Jan 1997
EventProceedings of the 1996 77th World Conference of the Textile Institute. Part 1 (of 2) - Tampere, Finland
Duration: 22 May 199624 May 1996

Conference

ConferenceProceedings of the 1996 77th World Conference of the Textile Institute. Part 1 (of 2)
CountryFinland
CityTampere
Period22/05/9624/05/96

ASJC Scopus subject areas

  • Materials Science(all)

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