New clock-feedthrough cancellation method for second-generation switched-current circuits

Chi Kong Tse, M. H L Chow

Research output: Journal article publicationConference articleAcademic researchpeer-review

6 Citations (Scopus)


In second-generation switched-current circuits, the effect of charge injection, which manifests itself as clock-feedthrough, seriously affects the accuracy of the sampling operation which is required by any sampled-data system. In this paper a new method is proposed to tackle the problem of clock-feedthrough in the second-generation circuits. This method is based on the use of a 'dummy circuit' which superposes the same amount of error in the opposite direction. The technique can be applied to the any second-generation cell such as the current memory and the delay cell. SPICE simulations are performed which verify the feasibility of the proposed technique in cancelling clock-feedthrough effects.
Original languageEnglish
Pages (from-to)2104-2107
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
Publication statusPublished - 1 Jan 1995
EventProceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3) - Seattle, WA, United States
Duration: 30 Apr 19953 May 1995

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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