Abstract
In second-generation switched-current circuits, the effect of charge injection, which manifests itself as clock-feedthrough, seriously affects the accuracy of the sampling operation which is required by any sampled-data system. In this paper a new method is proposed to tackle the problem of clock-feedthrough in the second-generation circuits. This method is based on the use of a 'dummy circuit' which superposes the same amount of error in the opposite direction. The technique can be applied to the any second-generation cell such as the current memory and the delay cell. SPICE simulations are performed which verify the feasibility of the proposed technique in cancelling clock-feedthrough effects.
| Original language | English |
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| Pages (from-to) | 2104-2107 |
| Number of pages | 4 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| Volume | 3 |
| Publication status | Published - 1 Jan 1995 |
| Event | Proceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3) - Seattle, WA, United States Duration: 30 Apr 1995 → 3 May 1995 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials