New approaches to defect characterisation with high resolution non-contacting laser utrasound

S. Sharples; M. Clark; Michael Geoffrey Somekh

New approaches to defect characterisation with high resolution non-contacting laser utrasound

S. Sharples, M. Clark, Michael Geoffrey Somekh

Research output: Journal article publication › Conference article › Academic research › peer-review

Abstract

This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.

Original language	English
Pages (from-to)	786-789
Number of pages	4
Journal	Proceedings of the IEEE Ultrasonics Symposium
Volume	1
Publication status	Published - 1 Dec 2003
Externally published	Yes
Event	2003 IEEE Ultrasonics Symposium - Proceedings - Honolulu, HI, United States Duration: 5 Oct 2003 → 8 Oct 2003

ASJC Scopus subject areas

Acoustics and Ultrasonics

Cite this

@article{825f8bb5bc89433285352b400dea2303,

title = "New approaches to defect characterisation with high resolution non-contacting laser utrasound",

abstract = "This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.",

author = "S. Sharples and M. Clark and Somekh, {Michael Geoffrey}",

year = "2003",

month = dec,

day = "1",

language = "English",

volume = "1",

pages = "786--789",

journal = "Proceedings of the IEEE Ultrasonics Symposium",

issn = "1051-0117",

publisher = "IEEE",

note = "2003 IEEE Ultrasonics Symposium - Proceedings ; Conference date: 05-10-2003 Through 08-10-2003",

}

TY - JOUR

T1 - New approaches to defect characterisation with high resolution non-contacting laser utrasound

AU - Sharples, S.

AU - Clark, M.

AU - Somekh, Michael Geoffrey

PY - 2003/12/1

Y1 - 2003/12/1

N2 - This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.

AB - This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.

UR - http://www.scopus.com/inward/record.url?scp=4143078254&partnerID=8YFLogxK

M3 - Conference article

SN - 1051-0117

VL - 1

SP - 786

EP - 789

JO - Proceedings of the IEEE Ultrasonics Symposium

JF - Proceedings of the IEEE Ultrasonics Symposium

T2 - 2003 IEEE Ultrasonics Symposium - Proceedings

Y2 - 5 October 2003 through 8 October 2003

ER -

New approaches to defect characterisation with high resolution non-contacting laser utrasound

Abstract

ASJC Scopus subject areas

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