New approaches to defect characterisation with high resolution non-contacting laser utrasound

S. Sharples, M. Clark, Michael Geoffrey Somekh

Research output: Journal article publicationConference articleAcademic researchpeer-review

Abstract

This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.
Original languageEnglish
Pages (from-to)786-789
Number of pages4
JournalProceedings of the IEEE Ultrasonics Symposium
Volume1
Publication statusPublished - 1 Dec 2003
Externally publishedYes
Event2003 IEEE Ultrasonics Symposium - Proceedings - Honolulu, HI, United States
Duration: 5 Oct 20038 Oct 2003

ASJC Scopus subject areas

  • Acoustics and Ultrasonics

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