Modelling thermal runaway of cylindrical battery under sub-atmospheric pressure

Yanhui Liu, Changxiang He, Gregory Offer, Huizhi Wang, Xinyan Huang, Tianshou Zhao

Research output: Journal article publicationJournal articleAcademic researchpeer-review

6 Citations (Scopus)

Abstract

The storage and transportation of lithium-ion batteries under reduced ambient pressure have critical safety concerns. This work develops a model to simulate and understand the thermal runaway of a cylindrical battery cell at different sub-atmospheric pressures. A lumped heat transfer model for batteries is upgraded by considering the increasing electrolyte loss observed in experiments as pressure decreases. Using the model, we examine the impacts of ambient pressure, cell heating rate, and safety-venting threshold on battery thermal failure, with a particular focus on safety venting and thermal runaway. Before safety venting, the internal cell pressure is raised initially by electrolyte vaporisation and then by gases produced from chemical reactions. As the safety valve threshold rises from 1.2 MPa to 2.2 MPa, the gas from SEI decomposition increases from 73.5 % to 82.3 % at the moment of safety venting. The incubation period between venting and thermal runaway increases as the ambient pressure decreases. In other words, lowering the ambient pressure allows more emergency response time before thermal runaway. The developed model approach and simulations improve our understanding of thermal runaway under low ambient pressures and provide novel insights for ensuring battery safety in storage and transportation.

Original languageEnglish
Article number236363
JournalJournal of Power Sources
Volume633
DOIs
Publication statusPublished - 30 Mar 2025

Keywords

  • Battery safety
  • Cell pressure
  • Low ambient pressure
  • Numerical simulation
  • Venting

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Energy Engineering and Power Technology
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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