Modelling of photoreflectance phenomena in layered media

M. Liu, M. B. Suddendorf, Michael Geoffrey Somekh, S. J. Sheard

Research output: Journal article publicationJournal articleAcademic researchpeer-review

10 Citations (Scopus)

Abstract

This paper presents a detailed three-dimensional analysis for the modelling of the photoreflectance effect, in particular the response of layered samples is considered. The dependence of the photoreflectance signal on various parameters such as lifetime, surface recombination velocity and carrier diffusion coefficient is discussed. It is shown that the carrier diffusion coefficient and the thermal diffusivity play an important role in determining the signal level from the photoreflectance system. The effects of the wavelength of the pump and probe beams are also discussed. Furthermore, a fast numerical algorithm, allowing for a rapid computational evaluation, has been applied.
Original languageEnglish
Article number026
Pages (from-to)1639-1647
Number of pages9
JournalSemiconductor Science and Technology
Volume8
Issue number8
DOIs
Publication statusPublished - 1 Dec 1993
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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