Modeling of Ultrasonic Nonlinearities for Debris Cloud-Induced Micro-Voids Characterization: Theoretical Analysis and Numerical Validation

Wuxiong Cao, Baojun Pang, Zhongqing Su, Runqiang Chi, Yuan Cai, Yefei Huang

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

2 Citations (Scopus)

Abstract

Micro-damage, from dimples through micro-voids to micro-cracks, are formed underneath the pitting damage due to the debris cloud hypervelocity impact (HVI). Evaluation of this specific type of micro-damage is far beyond the detectability of conventional approaches using guided ultrasonic waves (GUWs), because the large number of micro-voids in the pitting damage region cause highly complex. Targeting the quantitative characterization of these micro-voids, an analytical model is developed to interpret the generation of high-order modes when a GUW traversing from the perspective of linear and nonlinear GUW features. Validation of this theoretical analysis is ascertained via numerical simulation. On this basis, an evaluation framework is developed whereby the micro-voids can be quantitatively depicted.

Original languageEnglish
Title of host publicationProceedings of the 2019 13th Symposium on Piezoelectrcity, Acoustic Waves, and Device Applications, SPAWDA 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728106137
DOIs
Publication statusPublished - 4 Apr 2019
Event13th Symposium on Piezoelectrcity, Acoustic Waves, and Device Applications, SPAWDA 2019 - Harbin, China
Duration: 11 Jan 201914 Jan 2019

Publication series

NameProceedings of the 2019 13th Symposium on Piezoelectrcity, Acoustic Waves, and Device Applications, SPAWDA 2019

Conference

Conference13th Symposium on Piezoelectrcity, Acoustic Waves, and Device Applications, SPAWDA 2019
Country/TerritoryChina
CityHarbin
Period11/01/1914/01/19

Keywords

  • Debris cloud
  • Guided ultrasonic wave (GUW)
  • Hypervelocity impact (HVI)
  • Micro-voids

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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