Modeling of cascading failures in cyber-coupled power systems

Dong Liu, Xi Zhang, Choujun Zhan, Chi Kong Tse

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

4 Citations (Scopus)

Abstract

In this paper, we develop a stochastic model from the perspective of complex networks to investigate the effects of cyber coupling on cascading failures in coupled power systems. The failure spreading in the coupled system is described by state transition and modeled as a Markov process. We simulate the dynamic profile of the cascading failures caused by the attack of cyber malwares, considering the effects of power overloading, contagion and interdependence between power grids and cyber networks. We study the coupled system created by coupling the UIUC 150 Bus System with synthesized scale-free cyber network. Simulation results present that the dynamic profile of the cascading failures in a coupled system displays a staircase-like pattern which can be interpreted as a combined feature of the typical step propagation profile triggered repeatedly by cyber attacks due to cyber network coupling. Results also show that cyber coupling can intensify both the extent and rapidity of power blackouts. Moreover, adopting assortative coupling patten accelerates the failures propagation, in particular under high-degree cyber node targeted attack.
Original languageEnglish
Title of host publicationIEEE International Symposium on Circuits and Systems
Subtitle of host publicationFrom Dreams to Innovation, ISCAS 2017 - Conference Proceedings
PublisherIEEE
ISBN (Electronic)9781467368520
DOIs
Publication statusPublished - 25 Sep 2017
Event50th IEEE International Symposium on Circuits and Systems, ISCAS 2017 - Baltimore, United States
Duration: 28 May 201731 May 2017

Conference

Conference50th IEEE International Symposium on Circuits and Systems, ISCAS 2017
CountryUnited States
CityBaltimore
Period28/05/1731/05/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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