Misorientation texture of post-recrystallized α-brass

Studies of annealing textures in the past were mainly based on X-ray diffraction for macrotexture and electron diffraction for microtexture. However, the application of the electron back-scattering (EBS) technique now provides a powerful tool to obtain grain-boundary misorientation data (the grain misorientation texture or GMT) and study the change in grainboundary structure during annealing. The change in the GMT of cold-rolled brass annealed at two different temperatures is reported. The proportion of CSL boundaries was found to increase with annealing temperature. The significance of this finding with regards to an understanding of the texture transition and the grain-growth phenomenon is discussed.