Minimum detectable signals of integrated magnetic sensors in bulk CMOS and SOI technologies for magnetic read heads

Jack Lau; Cuong T. Nguyen; Ping K. Ko; Philip Ching Ho Chan

doi:10.1016/S0924-4247(97)80029-5

Minimum detectable signals of integrated magnetic sensors in bulk CMOS and SOI technologies for magnetic read heads

Jack Lau, Cuong T. Nguyen, Ping K. Ko, Philip Ching Ho Chan

Research output: Journal article publication › Journal article › Academic research › peer-review

4 Citations (Scopus)

Abstract

Ease of fabrication and the signal-to-noise ratio are two important parameters for integrated magnetic sensors. Sensors fabricated in both bulk CMOS and silicon on insulator (SOI) technologies enjoy the benefit of ease of fabrication. In this paper, we study the signal-to-noise ratios of various CMOS magnetic sensors. We show that the minimum detectable signal (MDS) for a split-drain magnetic sensor is proportional to Sa-1I-3/2while that for the linear carrier-domain magnetometer (LCDM) and lateral thyristive magnetometer (LTM) in SOI technologies is Sa-1I-1/2.

Original language	English
Pages (from-to)	636-640
Number of pages	5
Journal	Sensors and Actuators, A: Physical
Volume	54
Issue number	1-3
DOIs	https://doi.org/10.1016/S0924-4247(97)80029-5
Publication status	Published - 1 Jan 1996
Externally published	Yes

Keywords

Magnetic sensors
Minimum detectable signals
Read heads
SOI

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Instrumentation
Condensed Matter Physics
Surfaces, Coatings and Films
Metals and Alloys
Electrical and Electronic Engineering

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10.1016/S0924-4247(97)80029-5

Cite this

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title = "Minimum detectable signals of integrated magnetic sensors in bulk CMOS and SOI technologies for magnetic read heads",

abstract = "Ease of fabrication and the signal-to-noise ratio are two important parameters for integrated magnetic sensors. Sensors fabricated in both bulk CMOS and silicon on insulator (SOI) technologies enjoy the benefit of ease of fabrication. In this paper, we study the signal-to-noise ratios of various CMOS magnetic sensors. We show that the minimum detectable signal (MDS) for a split-drain magnetic sensor is proportional to Sa-1I-3/2while that for the linear carrier-domain magnetometer (LCDM) and lateral thyristive magnetometer (LTM) in SOI technologies is Sa-1I-1/2.",

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AU - Lau, Jack

AU - Nguyen, Cuong T.

AU - Ko, Ping K.

AU - Chan, Philip Ching Ho

PY - 1996/1/1

Y1 - 1996/1/1

N2 - Ease of fabrication and the signal-to-noise ratio are two important parameters for integrated magnetic sensors. Sensors fabricated in both bulk CMOS and silicon on insulator (SOI) technologies enjoy the benefit of ease of fabrication. In this paper, we study the signal-to-noise ratios of various CMOS magnetic sensors. We show that the minimum detectable signal (MDS) for a split-drain magnetic sensor is proportional to Sa-1I-3/2while that for the linear carrier-domain magnetometer (LCDM) and lateral thyristive magnetometer (LTM) in SOI technologies is Sa-1I-1/2.

AB - Ease of fabrication and the signal-to-noise ratio are two important parameters for integrated magnetic sensors. Sensors fabricated in both bulk CMOS and silicon on insulator (SOI) technologies enjoy the benefit of ease of fabrication. In this paper, we study the signal-to-noise ratios of various CMOS magnetic sensors. We show that the minimum detectable signal (MDS) for a split-drain magnetic sensor is proportional to Sa-1I-3/2while that for the linear carrier-domain magnetometer (LCDM) and lateral thyristive magnetometer (LTM) in SOI technologies is Sa-1I-1/2.

KW - Magnetic sensors

KW - Minimum detectable signals

KW - Read heads

KW - SOI

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DO - 10.1016/S0924-4247(97)80029-5

M3 - Journal article

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VL - 54

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EP - 640

JO - Sensors and Actuators, A: Physical

JF - Sensors and Actuators, A: Physical

IS - 1-3

ER -

Minimum detectable signals of integrated magnetic sensors in bulk CMOS and SOI technologies for magnetic read heads

Abstract

Keywords

ASJC Scopus subject areas

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