Abstract
We studied the microstructure of SrTiO3/SrRuO3bilayer films on (001) LaAlO3substrates by high-resolution transmission electron microscopy. At the SrRuO3/LaAlO3interface a defect configuration of stacking faults and nanotwins bounding either Frank partial dislocations or Shockley partial dislocations and complex interaction between these planar defects were found to be the dominant means of misfit accommodation. The misfit in the SrTiO3/SrRuO3system, however, is mainly accommodated by elastic strain. Most of the observed defects in the SrTiO3layer can be related to the (111) planar defects in the SrRuO3layer propagating and reaching the SrTiO3/SrRuO3interface. Furthermore, a (110) planar defect can also be introduced in the SrTiO3layer due to the structure change of the SrTiO3/SrRuO3interface.
Original language | English |
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Pages (from-to) | 3443-3450 |
Number of pages | 8 |
Journal | Journal of Materials Research |
Volume | 16 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1 Jan 2001 |
Externally published | Yes |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering