Microstructure and misfit relaxation in SrTiO3/SrRuO3bilayer films on LaAlO3(100) substrates

J. S. Wu, C. L. Jia, K. Urban, Jianhua Hao, X. X. Xi

Research output: Journal article publicationJournal articleAcademic researchpeer-review

38 Citations (Scopus)

Abstract

We studied the microstructure of SrTiO3/SrRuO3bilayer films on (001) LaAlO3substrates by high-resolution transmission electron microscopy. At the SrRuO3/LaAlO3interface a defect configuration of stacking faults and nanotwins bounding either Frank partial dislocations or Shockley partial dislocations and complex interaction between these planar defects were found to be the dominant means of misfit accommodation. The misfit in the SrTiO3/SrRuO3system, however, is mainly accommodated by elastic strain. Most of the observed defects in the SrTiO3layer can be related to the (111) planar defects in the SrRuO3layer propagating and reaching the SrTiO3/SrRuO3interface. Furthermore, a (110) planar defect can also be introduced in the SrTiO3layer due to the structure change of the SrTiO3/SrRuO3interface.
Original languageEnglish
Pages (from-to)3443-3450
Number of pages8
JournalJournal of Materials Research
Volume16
Issue number12
DOIs
Publication statusPublished - 1 Jan 2001
Externally publishedYes

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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