Microstructural and magnetic characterization of ion-beam bombarded [Ni₈₀Fe₂₀-Cr]₅₀ thin films

Chao Zheng, Ko Wei Lin, Chi Hsin Liu, Hsun Feng Hsu, Chi Wah Leung, Wei Hsien Chen, Te Ho Wu, Ryan D. Desautels, Johan Van Lierop, Philip W.T. Pong

Research output: Journal article publication › Journal article › Academic research › peer-review

8 Citations (Scopus)

Keyphrases

Material Science

Engineering